Generalization of search state equivalence for automatic test pattern generation
Xinghao Chen, M.L. Bushnell · 2002
We present a generalization of the equivalent search state (EST) approach for test generation. A search state represents the current search status based on prior search decisions. The generalized EST identifies 56% more previously-searched decision spaces than its predecessor on the 1985 ISCAS benchmarks. We present the enabling theorem with a proof, results and an example for sequential circuit test generation.