Intelligent backtracking in test generation for combinational circuits
W.B. Zeng, Daozheng Wei · 2003
An intelligent backtracking algorithm for the test generation of combinational circuits is introduced. This algorithm, called INBACK, differs from PODEM and FAN in that, when a contradiction occurs, it chooses a backtracking element which is most likely to eliminate the contradiction and change its value. An efficient method of identifying such backtracking elements is established. Experiments on 5 of 10 benchmark circuits with this method show that the average backtracking times are reduced.>