CMOS standard cells characterization for defect based testing
Witold Adam Pleskacz, Dominik Kasprowicz, T. Oleszczak, W. Kuźmicz · 2002
This paper extends the CMOS standard cells characterization methodology for defect based testing. The proposed methodology allows to find the types of faults which may occur in a real IC, to determine their probabilities, and to find the input test vectors which detect these faults. For shorts at the inputs two types of cell simulation conditions - "Wired-AND" and "Wired-OR" are used. Examples of industrial standard cells characterization indicate that a single logic fault probability table is not sufficient. Separate tables for " Wired-AND " and " Wired-OR" conditions at the inputs are needed for full characterization and hierarchical test generation.