Compositional Generation of MC/DC Integration Test Suites
Alexander Pretschner · Electronic Notes in Theoretical Computer Science · 2003
We present a method for automatically generating tests for reactive systems specified by concurrently executing extended finite state machines. The generated test suites satisfy the modified condition/decision coverage criterion at unit and integration levels. The generation of MC/DC suites for eager first-order functional programs is subsumed. An industrial chip card case study illustrates the approach.