Computing optimal test sequences from complete test sets for stuck-open faults in CMOS circuits
Sourish Chakravarty, Sujith Ravi · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 1990
A sequence of input vectors which detects all transistor stuck-open faults in a CMOS combinational circuit is a complete test sequence. Given a complete set of two-pattern tests for transistor stuck-open faults in a CMOS circuit, it is shown that a complete test sequence of minimum length can be obtained efficiently. A precise description of this problem and examples to illustrate the method are presented.>