Algorithm-based fault detection of analog linear time-invariant circuits
Zhen Guo, Jacob Savir · 2002
Three methods are introduced in this paper for detecting parametric faults in linear time-invariant circuits. All methods use the aggregation of the digitized output values as the circuit good-machine signature. Tolerance values that discriminate between the good and the bad circuit are being investigated. Experiments conducted on a small circuit are used to test the viability of the test methodology.