Extraction of critical areas for opens in large VLSI circuits
Chengtian Ouyang, Witold Adam Pleskacz, Wojciech P. Maly · 2002
This paper describes a new algorithm for the extraction of the critical area for opens. The presented algorithm allows for the analysis of large ICs and non-Manhattan geometry. Concept of the contact/via contacting regions is proposed and its relevance is discussed. Illustrative examples of the proposed algorithm are presented.