A study of the robustness of pseudorandom binary-array-based surface characterization
J.W. Spoelder, Frans M. Vos, Emil M. Petriu, F. C. A . Croen · IEEE Transactions on Instrumentation and Measurement · 1998
In this paper me report on aspects of the use of color-coded pseudorandom binary arrays (PRBA's) to model three-dimensional scenes. We evaluate the accuracy and the robustness of the pattern recognition phase in the process. Emphasis is on the added value of the use of PRBA's as a tool to make the image processing robust and highly noise insensitive.