Benchmarking of test-generation systems
Prabhakar Goel, H. Chen · 1988
Several aspects to consider in the benchmarking of automatic test-generation systems are discussed. In particular, the important issues in creating benchmark circuits for automatic test-pattern generation are explored, emphasizing speed/capacity testing. An attempt is made to explain the ways in which depth of circuitry, local vs. global feedback, synchronous vs. asynchronous logic, number of primitives, and structural characteristics of subcircuits relate to the costs of automatic test-generation.>