Test Scheduling for Memory Cores with Built-In Self-Repair
Tomokazu Yoneda, Yuusuke Fukuda, Hideo Fujiwara · 2007
This paper presents a stage-based test scheduling for memory cores with BISR scheme under power constraint. We introduce a model to compute the expected test time for a given test schedule for memory cores with BISR scheme based on pass probabilities, and propose a test scheduling algorithm to minimize the expected test time. Experimental results show a significant expected test time reduction compared to the core-based test scheduling method which minimizes the test time.