TOSCA: Total Scan Power Reduction Architecture based on Pseudo-Random Built-in Self Test Structure
Youbean Kim, Dongsup Song, Kicheol Kim, Incheol Kim, Sungho Kang · Asian Test Symposium · 2006
Power of scan operation is dominant factor. This paper proposed the structure to reduce scan power totally. The total scan power reduction architecture uses a duplicated transition monitoring window and sub-scan chains. Experimental results show 60% transition reduction, 2~4% fault coverage improvement, and 25% scan-in and 26% scan-out transition by the TOSCA.