Diagnostic test generation for transition faults using a stuck-at ATPG tool
Yoshinobu Higami, Yosuke Kurose, Satoshi Ohno, Yamaoka Hironori, Hiroshi Takahashi, Yoshihiro Shimizu, Takashi Aikyo, Yuzo Takamatsu · 2009
This paper presents a diagnostic test generation method for transition faults. As two consecutive vectors application mechanism, launch on capture test is considered. The proposed algorithm generates test vectors for given fault pairs using a stuck-at ATPG tool so that they are distinguished. If a given fault pair is indistinguishable, it is identified. Therefore the proposed algorithm provides a complete test generation regarding the distinguishability. The conditions for distinguishing a fault pair are carefully considered, and they are transformed into the conditions of the detection of a stuck-at fault, and some additional logic are inserted in a CUT for the test generation. Experimental results show that the proposed method can generate test vectors for distinguishing the fault pairs that are not distinguished by commercial tools, and also identify all the indistinguishable fault pairs.