The evaluation of full sensitivity for test generation in MVL circuits
Elena Dubrova, Dilian Gurov, Jon C. Muzio · 2002
The evaluation of a method for test generation for MVL circuits, based on the notion of full sensitivity, is given. The estimation is made on the functional level, by establishing a lower bound on the number of m-valued n-variable functions that are fully sensitive to all their variables. It is shown, that for practical values of m and n, the fraction of functions not fully sensitive to all their variables is extremely small. The consequences of this result in terms of test generation are discussed.