Robust optimization based backtrace method for analog circuits
Alfred V. Gomes, Abhijit Chatterjee · 1999
In this paper, we propose a new robust approach to signal backtrace for efficiently testing embedded analog modules in a large system. The proposed signal backtrace method is formulated as a solution to a multi-point boundary value problem(BVP), with constraints on the output state and the input. This error constraint minimizes large spurious deviations in the input signal and the convergence prob-lems that arise if multiple solutions exist or if the desired signal does not exist in the feasible signal space. As an additional attractive ad-vantage, this formulation preserves the core iteration structure of a SPICE-like simulator without modifications, greatly easing imple-mentation. 1