Low-cost and efficient digital-compatible BIST for analog circuits using pulse response sampling
P.N. Variyam, A. Chatterjeee, Naveena Nagi · 2002
In this paper an efficient low-cost built-in self test (BIST) scheme is proposed for analog circuits. The key idea is to use rectangular pulses of random widths obtained directly from a digital linear feedback shift register to perform transient testing of the circuit under test. A small amount of synchronization and comparison circuitry is necessary to perform the BIST. A methodology for designing the BIST hardware is described and results are discussed. The method is seen to be both efficient and low cost.