Zero defects or zero stuck-at faults-CMOS IC process improvement with I/sub DDQ/
Jerry M. Soden, R.R. Fritzemeier, Charles F. Hawkins · 2002
The authors suggest that continuous quality improvement with the goal of zero defects requires a physical defect metric which goes beyond 100% SAF (stuck-at-fault) coverage. It is further suggested that I/sub DDQ/ testing is a highly efficient technique for detecting most dominant types of CMOS IC defects and therefore should be considered for the manufacture of high-quality, high reliability CMOS ICs. >