Fundamentals of testability-a tutorial
R.R. Fritzemeier, H. Troy Nagle, Charles F. Hawkins · IEEE Transactions on Industrial Electronics · 1989
A review is presented of electrical testing, failure mechanisms, fault models, fault simulation, testability analysis, and test-generation methods for CMOS VLSI circuits. The relationships between the most commonly used fault models are explored. Various fault simulation methods are contrasted. The basic mechanisms used in test-vector generation are illustrated by examples. The importance of testability analysis as a guide to design and test generation is discussed. Algorithms for automatic test-pattern generation are summarized.>