Multi-Frequency Test Access Mechanism Design for Modular SOC Testing
Qiang Xu, Nicola Nicolici · 2005
This paper investigates the applicability of multi-frequency test access mechanism (TAM) design for reducing the system-on-a-chip (SOC) test application time. Based on the bandwidth matching concept the proposed algorithms explore a larger solution space, which, as shown by experimental data, can lead to improved test application time.