Autonomous test scheme for analog ASICs
N.-C. Lee · Third Annual IEEE Proceedings on ASIC Seminar and Exhibit · 2002
Analog autonomous test (AAT) is a structured design-for-testability methodology for mixed analog/digital ICs. By using analog switches and test-bus to gain controllability and observability, a chip is partitioned into testable submodules for production testing. Therefore, both test vector development period and production test time can be reduced.>