A new system architecture for a combined in-circuit/functional tester
J.M. Stepleton · 2003
The author describes a modular board tester architecture that provides high performance, at a low total cost of ownership, with the promise of future enhancements. The distributed architecture dictates the use of several unusual custom integrated circuits. The extensive use of integration allows each resource to have independent control of levels and timing at a reasonable cost. Fixture performance and accuracy specifications, the two major obstacles to higher usable test speeds with traditional systems, are significantly improved, allowing the performance of this system to be easily applied in normal testing environment.>