Equivalent IDDQ Tests for Systems with Regulated Power Supply
Chuen-Song Chen, Jien-Chung Lo, Tian Xia · 2006
This paper presents an equivalent current sensing technique for the applications o tests. This is accomplished by monitoring the operations of existing on-chip voltage regulators, which indirectly provides the IDDQinformation. Equivalent IDDQinformation is obtained by measuring an internal voltage signal of a regulator. Then, the measured data is shifted out using the IEEE 1149.1 standard. IDDQbased test methods are used to post-process those data for screening defective circuits. Experiments were successfully conducted assuming the TSMC 0.18mum CMOS technology