Pin open detection of BGA IC by supply current testing
Akira Ono, Hiroyuki Yotsuyanagi, Masaki Hashizume · 2014
In this paper, we propose a test method for detecting pin opens of CMOS logic ICs in assembled PCBs. The test method is based on supply current of a circuit under test which flows when a time-varying signal is provided to a targeted pin with a test probe as a stimulus. Test signal's amplitude is less than VDD. Test vector generations are not needed for the tests. In the test, the test probe also can be checked simultaneously. The test can be used on devices such as BGA ICs which solder parts are hidden from a field of view. We show by some experiments that pin opens of BGA ICs can be detected by the supply current test method.