A highly testable 1-out-of-3 CMOS checker
Cecilia Metra, Michele Favalli, Piero Olivo, B. Riccò · 2002
The problem of the design of a highly testable 1-out-of-3 CMOS checker has been considered. First some recently presented CMOS checkers have been analyzed, then a novel checker has been proposed to be certainly preferable from the self-testing capability and overall performance point of view.