How we test Siemens Embedded DRAM Cores
R. McConnell, U. Moller, Daniel Richter · 2002
The techniques used to test Siemens Embedded DRAM Cores are described. Test Isolation and Design-For-Test logic is built in to the core interface, while external access and Algorithmic Pattern Generation are handled by a central Test Controller. All tests used for standard DRAM's can be applied to the DRAM cores, but only a subset of these are used for any given product.