Automated synthesis of large phase shifters for built-in self-test
Janusz Rajski, Nagesh Tamarapalli, Jerzy Tyszer · 2002
The paper introduces a new algorithm for the automated synthesis of phase shifters-circuits used to remove effects of structural dependencies featured by two-dimensional test generators. The algorithms presented in the paper synthesize in a time-efficient manner very large and fast phase shifters for built in self-test environment, with guaranteed minimal phase shifts between scan chains, and very low delay and area of virtually one 2-way XOR gate per channel.