Localization and aftereffect of automatic test generation
Zhongcheng Li, Yuqi Pan, Yinghua Min · 2003
Improvement on efficiency of test pattern generation (TPG) algorithms for large combinational circuits has long been a major concern. Two new concepts, localization and aftereffect, are introduced to enhance the efficiency. Based on the concepts, three techniques, partial implication, aftereffect of identified undetectable faults and shared sensitization, are adopted in a TPG system, SABATPG. Experiments for the 10 ISCAS benchmark circuits show that the computing time of SABATPG for test generation is 19.42% shorter than that of FAN algorithm.>