Low Power Scan Shift and Capture in the EDT Environment
Dariusz Czysz, Mark Kassab, Xijiang Lin, Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer · 2008
This paper presents a new and comprehensive power-aware test scheme compatible with a test compression environment. The key contribution of the paper is a flexible test application framework that achieves significant reductions in switching activity during all phases of scan test: scan loading, unloading, and capture.