Design for diagnosability of CMOS circuits
Wen Xiaoqing, T. Honzawa, Hideo Tamamoto, Kewal K. Saluja, K. Kinoshita · 2002
This paper presents a new approach to improving the diagnosability of a CMOS circuit by dividing it into independent partitions and using a separate power supply for each partition. This technique makes it possible to implement multiple I/sub DDQ/ measurement points. As a result, the diagnosability of the circuit can be improved. The problem of partitioning a circuit is addressed and optimum and heuristic solutions are proposed. The effectiveness of our approach is demonstrated through experimental results.