Reliability modeling of nanoelectronic circuits
Jie Han, E. Taylor, Jianbo Gao, J.A.B. Fortes · 2005
Reliability and its modeling have become critical issues for nanotechnology-based circuits. This paper considers the use of probabilistic models of unreliable logic gates to estimate the reliability of nanoelectronic circuits and derive fundamental error bounds for logic gates. Two methods are experimentally contrasted with respect to accuracy and computational complexity.