A new test scheduling algorithm for VLSI systems
M.K. Garg, Amit Ranjan Basu, T.C. Wilson, D.K. Banerji, Jayanti C. Majithia · 1991
Presents a new test scheduling algorithm based on a new heuristic approach. A new concept of time zone tree has been proposed and the algorithm builds up the tree based on a heuristic cost function. The performance of the algorithm has been compared with existing algorithms and it demonstrates encouraging results.>