Analog fault detectability based on statistical circuit analysis
Dimitris K. Papakostas, V.C. Kosmidis, Alkis A. Hatzopoulos · 2002
Statistical multi-parameter circuit simulation is used in this work, in order to estimate the fault detection probability of various analog measurements. Since the method is a simulation-before-test approach, its computational complexity can be considered acceptable utilizing modern computer systems. Parameter deviations and multiple Monte-Carlo analysis are properly handled by a shell program, named MPCAP, which uses the SPICE simulator as a kernel. Theoretical analysis for the calculation of the probabilities is given, along with simulation results from an analog filter example.