A Production IR-Drop Screen on a Chip
Zahi Abuhamdeh, Bob Hannagan, Jeff Remmers, Alfred L. Crouch · IEEE Design & Test of Computers · 2007
Many modern designs have large, localized failures due to excessive power consumption, which can be measured as IR drop. The methodology described here employs an on-chip process-monitoring circuit that is easy to integrate on chip and use in a characterization or production environment, to help identify and localize IR-drop hot spots and power-related failures.