Built-in Self-test Scheme for IIR Digital Filter
Yang Decai, Chen Guangju, Xie Yongle · 2007
A built-in self-test (BIST) scheme is proposed for IIR digital filter chip. It needs no modification of the basic building cells and can detect all the non-redundant stuck-at faults in reasonable time. The testability of its cells is analyzed and the deterministic test sequence is deduced. By reusing available arithmetic function units such as adder to generate test vectors and compact test responses, this scheme can be implemented at-speed with minimum hardware overhead and performance degradation.