Fast and area-time efficient Berger code checkers
Yu-Yau Guo, Jien-Chung Lo, Cecilia Metra · 2002
In this paper we extend the direct implementation of threshold functions using ratioed FET circuits presented earlier. Such designs are fast, area-time efficient and highly testable with respect to a large class of realistic defects, e.g., resistive breaks and bridges. These threshold functions were then used as core of the new Berger code checkers. For 32-bit checkers, the proposed design has a 59% speed and a 72% area-time improvements over the conventional design assuming 1.2 /spl mu/m VLSI implementations.