Fault diagnosis of electronic system using artificial intelligence
B. Fenton, T.M. McGinnity, Liam Maguire · IEEE Instrumentation & Measurement Magazine · 2002
With increasing system complexity, shorter product life cycles, lower production costs, and changing technologies, the need for intelligent tools for all stages of a product's lifecycle is becoming increasingly important. The purpose of this article is to give a brief review how AI has been used in the field of electronic fault diagnosis. Topics discussed include: rule-based diagnostic systems; model-based diagnostic systems; case-based reasoning (CBR); fuzzy reasoning and artificial neural networks (ANN); hybrid approaches; IEEE diagnostic standards and automated diagnostic tool future developments.