On static test compaction and test pattern ordering for scan designs
Xijiang Lin, Janusz Rajski, Irith Pomeranz, Sudhakar M. Reddy · 2002
A static compaction procedure to reduce test set size for scan designs and a procedure to order test patterns in order to steepen the fault coverage curve are presented. The computational effort for both procedures is linearly proportional to the computational effort required for standard fault simulation with fault dropping. Experimental results on large industrial circuits demonstrate both the efficiency and effectiveness of the proposed procedures.