DYTEST: a self-learning algorithm using dynamic testability measures to accelerate test generation
Weiwei Mao, Micheal D. Ciletti · Design Automation Conference · 1988
This paper presents a self-learning algorithm using a dynamic testability measure to accelerate test generation. It also introduces the concepts of full logic value label backward implication, the dependent backtrack and K-limited backtracks. Results indicating a high fault coverage are also presented for ten benchmark combinational circuits.