An analogue electronic circuits specification driven testing with the use of time domain response's features
Piotr Jantos, Tomasz Golonek, Jerzy Rutkowski · Elektronika : konstrukcje, technologie, zastosowania · 2011
This paper presents a deterministic method of analogue electronic circuits' specification driven testing. This method is based on an analysis of a circuit-under-test time-domain response's to a pulse excitation. We are extracting the response's and its first order derivative minima and maxima locations. Then, the tested circuit's specifications are mapped into response's features planes. At the test stage, extracted response's features are used to predict specifications values. The decision about the test result (GO/NO-GO) is made with a simple deterministic inference system. Our testing method has been verified with a use of an exemplary circuit, a low-pass filter.