BIST circuit design for backplane interconnect test
Jong-Kwon Chang · Proceedings Third Russian-Korean International Symposium on Science and Technology. KORUS'99 (Cat. No.99EX362) · 2003
Backplane is a well-known method for inter-board connections. These boards are usually plugged into the backplane of the communication systems and are used to exchange signal with each other via backplane interconnects. Faults can be incidentally introduced whenever a board is removed or replaced or added. Thus, the backplane interconnect testing is a very important process to verify the operation of the communication system. In this paper, a BIST (built-in self test) technique is adopted to minimize the cost of test equipment and to detect faults automatically. This BIST circuit was implemented using the N+1 algorithm to detect multiple faults and the IEEE Std. 1149.1 Boundary Scan Architecture methodology to inject test vectors.