DESIGN FOR TESTABILITY USING SCANPATH TECHNIQUES FOR PATH-DELAY TEST AND MEASUREMENT
Bulent I. Dervisoglu, Gayvin E. Stong · 2005
1. Abstract This paper describes a novel flip-flop design which is used in performing internal path-delay test and measurement using scanpath technique:;. Also described is the design for a boundary-scan cell that enables inpUtlOUtpUt delays to be measured. The paper includes a real-life application example.