ATPG Heuristics Dependant Observation Point Insertion for Enhanced Compaction and Data Volume Reduction
Santiago Remersaro, Janusz Rajski, Thomas Rinderknecht, Sudhakar M. Reddy, Irith Pomeranz · 2008
As digital circuits grow in gate count so does the data volume required for manufacturing test. To address this problem several test compression techniques have been developed. This paper presents a novel and scalable technique for inserting observation points to aid compression by reducing pattern count and data volume. Experimental results presented for industrial circuits demonstrate the effectiveness of the method.