A method to find don't care values in test sequences for sequential circuits
Yoshinobu Higami, S. Kobayashi, Yuzo Takamatsu, Seiji Kajihara, Irith Pomeranz · 2004
We propose a method to find don't care (X) values in a test sequence for a sequential circuit. Given a fully specified test sequence generated by a sequential ATPG, the proposed method produces a test sequence containing Xs without losing stuck-at fault coverage of the original test sequence.