Generation of correlated random patterns for the complete testing of synthesized multi-level circuits
S. Pateras, Janusz Rajski · 1991
The application of the novel concept of correlated random patterns to the testing of fully testable synthesized multi-level circuits is presented.The concept represents an alternative to weighted random pattern testing.Reductions in a circuit's random pattern test length are achieved by taking advantage of correlations measured between values applied at different input positions in a complete deterministic test.Experimental results show that correlated random patterns can achieve 100% fault coverage of synthesized circuits using orders of magnitude less patterns than when equiprobable random patterns are used.