Built-in self test architectures for multistage interconnection networks
Étienne Bernard, S. Simon, Josef A. Nossek · 1996
A novel built-in self test architecture for locally controlled cube-type N # N multistage interconnection networks (MINs) is presented. First, a state-based pseudoexhaustive test procedure for this class of MINs is outlined. Then, a labelling algorithm on a binary n-cube is described which generates the necessary inputs for the tests. From the dependence graph of this algorithm a tree architecture is derived which results in a hardware overhead of O#1= log N #. 1 INTRODUCTION The still rapidly growing complexity of integrated circuits results in a steady increase of system performance. However, these merits are drastically reduced due to the susceptibility of these circuits to physical hardware defects [1]. In order to ensure reliable function testing is indispensable. Since failures also occur in field operation, the systems have to be tested periodically during operation. But as it is impossible in many casesto provide expensive automatic test equipment, failures either have to be ...