On a theory of t-fault diagnosable analog systems
S. L. Hakimi, Kazuma Nakajima · IEEE Transactions on Circuits and Systems · 1984
The theory oft-fault diagnosable systems initiated by Preparata et al. has been studied for applications to automatic self-testing of large scale digital systems. Recently, Amin introduced another variation of their model. In this paper, we show that this model has an application to analog fault diagnosis. We further specialize Amin's model to obtain characterization theorems which are much more transparent and also are more suitable for this particular application.