A novel method for representing industrial inspection pattern
Yung‐Nien Sun, Chih-Ta Tsai · 2002
A critical step in industrial pattern inspection is to design an effective and flexible method for representing the inspected pattern. The authors propose a novel representation method called pattern attributed hypergraph (PAHG). The PAHG is used to describe the pictorial information of the input pattern, which includes attributed nodes, connectivity between nodes (intrarelation), regional primitives, and neighborhood relations between regions (spatial interrelation). It is found that the complexity of graph matching with the PAHG structure is much lower than the corresponding complexity of the graph structure used by A.M. Darwish and A.K. Jain (1988). The reduced complexity is approximately 1/K/sup 2/ of the original, where K is the number of regions in the inspected pattern. It provides a better and faster approach for industrial pattern inspection.>