A fault partitioning method in parallel test generation for large scale VLSI circuits
Zhide Zeng, Jihua Chen, Pengxin Liu · 2003
Firstly we propose a theoretical method to increase the speed-up ratio in parallel test generation based on fault partitioning. Based on this method, a new fault partitioning approach-Backward Fault Partitioning based on Output fan-in Cones (BFPOC)-is presented which combines the relevant fault identification and shortest path sensitization. In addition, BFPOC is compared via experiments with the approach of Toward Fault Partitioning based on Input fan-out Cones (TFPIC) proposed by Bannerjee (1994) and the widely used method-Equal Distance Partitioning of Fault Sequence (EDPFS) respectively. The results show that in a large-scale parallel processing environment, BFPOC can obtain higher speed-up ratio than the other two approaches.