Testing and design for testability of BiCMOS logic circuits
A.E. Salama, M.I. Elmasry · 2003
BiCMOS technology is one of the leading candidate technologies for VLSI circuits. The authors provide here the results of a simulation-based characterization study of different BiCMOS logic circuits. Different techniques for testing BiCMOS logic circuits are studied. A novel BiCMOS circuit structure that improves the testability of BiCMOS digital circuits is introduced.>