Power-Aware Test Framework for Network-on-Chip
Byung-Gyu Ahn, Jun-Mo Jung, Jong‐Wha Chong · 2008
In this paper, we propose the power-aware test framework for network-on-chip (NoC). First, the possibility of using embedded processor and on-chip network are introduced and evaluated with benchmark system to test the other embedded cores. Second, a new generation method of test pattern, which is called 'don't care mapping', is presented to reduce the power consumption of on-chip network. The experimental results show that the power consumption is reduced up to 8% at the communication components.