Accelerating Diagnosis via Dominance Relations between Sets of Faults
Rajsekhar Adapa, Spyros Tragoudas, M.K. Michael · Proceedings - IEEE VLSI Test Symposium/Proceedings of the ... IEEE VLSI Test Symposium · 2007
A new way of fault collapsing for effect-cause diagnosis is presented. In contrast to existing dominance-based methods which operate on a pair of faults, the proposed method operates on pairs of sets of faults. The impact of the proposed method is evaluated with respect to effect-cause diagnosis. Experimental results show that the proposed collapsing methods can reduce the diagnostic simulation time on an average of 31% when compared to the existing techniques